In standard diffraction experiments, ensembles of objects are characterized yielding
averaged, statistical properties (meaningful only if the ensemble is monodisperse).
Focused x-ray beams are used here to localize single nanostructures, identifying and
probing individual objects one by one. In a scanning mode, a 2-dimensional image of the
sample is recorded, which allows the reproducible alignment of a specific nanostructure
for analysis. The x-ray scattered signal is analyzed and modelled, to give access to the
shape, strain and composition inside the single object with sub-micron resolution.
Combination of x-ray microdiffraction technique with other micro-probe experiments on the
very same individual object (simultaneous coupling of x-ray diffraction measurements with
atomic force microscopy (AFM)) is also shown; we prove the possibility to interact with
the objects and to address elastic properties for individual nano-structures out of an