Multilayers and superlattices are of great industrial interest because of their specific properties (magnetic, electronic, tribological…). Multilayers stacking are often in a very high state of intrinsic stress (some GPa) and for reliable integrated devices to be made it is capital to control and understand these intrinsic as well as extrinsic stresses. The objective of the present work is therefore the understanding of the origin of stresses and strains in multilayered metallic materials. Of course, a comparison of the different techniques which can be used for stress determination is a necessary first step of this study. In this aim, we have studied Ag/Ni multilayers, Ag and Ni thin films and Ag/Ni bilayers obtained by sputtering. The stresses have been determined via curvature measurement using both a laser scanning method and X-ray diffraction rocking curves technique, and via X-ray diffraction measurement of several d-spacings which act as in-situ strain gauges (also called the sin2ψ method and related methods). The obtained results from these different techniques are discussed in terms of accuracy, reproducibility and advantages / drawbacks. The obtained stresses from these methods cannot be directly compared and a specific discussion is developed around the relation between the measured strains and stresses and the microstructure of the materials.