10 results
Addressing Vibrational Excitations in Van der Waals Materials and Molecular Layers Within Electron Energy Loss Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 408-409
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- August 2018
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Performance and Applications of the Aberration Corrected TEM and STEM Instruments at the Ernst Ruska-Centre
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 128-129
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- August 2007
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¡§A New Era of Imaging.¡¨ New Results Beyond the 1 Ångström Barrier
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1466-1467
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- August 2006
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Atomistic Modeling of the Detailed Structure of Si/SiO2 Interfaces Using AIDATEM (Ab-initio Interface Defect detection by Analytic Transmission Electron Microscopy)
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 826-827
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- August 2003
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Atomic Resolution Z-contrast Imaging and EELS: Application for Ge/SiO2 Interface
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 818-819
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- August 2003
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Z-Contrast Imaging of Dislocation Cores at the Si/GaAs Interface
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1604-1605
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- August 2002
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Z-contrast Imaging and EELS of Dislocation Cores at the Si/GaAs Interface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 744 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, M1.6
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- 2002
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Copper Electroplating for Damascene ULSI Interconnects
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- MRS Online Proceedings Library Archive / Volume 514 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 275
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- 1998
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Electrochemical and Material Study of Electroless Ternary Barriers for Copper Interconnects
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- MRS Online Proceedings Library Archive / Volume 514 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 433
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- 1998
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Electroless CoWP Barrier/Protection Layer Deposition for Cu Metallization
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- Journal:
- MRS Online Proceedings Library Archive / Volume 451 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 463
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- 1996
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