5 results
Effect of Induced Stimuli on the Leakage Current of Operative Oxide-based Devices inside a TEM
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 820-821
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
Birth of a grain boundary: In situ TEM Observation of the Microstructure Evolution in HfO2 Based Memristors
-
- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1238-1239
- Print publication:
- August 2021
-
- Article
-
- You have access
- Export citation
Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets
-
- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1908-1909
- Print publication:
- August 2020
-
- Article
-
- You have access
- Export citation
Transforming Transmission Electron Microscopy with MerlinEM Electron Counting Detector
-
- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1944-1945
- Print publication:
- August 2020
-
- Article
-
- You have access
- Export citation
Correlation of Structural Modifications by Multiscale Phase Mapping in Filamentary Type HfO2-based RRAM: Towards a Component Specific in situ TEM Investigation
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1842-1843
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation