5 results
Measure of carrier lifetime in nanocrystalline silicon thin films using transmission modulated photoconductive decay
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1245 / 2010
- Published online by Cambridge University Press:
- 01 February 2011, 1245-A16-11
- Print publication:
- 2010
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Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1123 / 2008
- Published online by Cambridge University Press:
- 21 March 2011, 1123-P03-08
- Print publication:
- 2008
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Comparison of Techniques for Measuring Recombination Lifetime in Photovoltaic Materials: Trapping Effects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 974 / 2006
- Published online by Cambridge University Press:
- 26 February 2011, 0974-CC01-01
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- 2006
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Analysis of Ion Implantation Damage in Silicon Wafers by a Contactless Microwave Diagnostic
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- Journal:
- MRS Online Proceedings Library Archive / Volume 699 / 2001
- Published online by Cambridge University Press:
- 17 March 2011, R4.2
- Print publication:
- 2001
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DX-Center in Se-Doped AlxGa1-xAs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 163 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 781
- Print publication:
- 1989
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