1 results
Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue 5 / October 2012
- Published online by Cambridge University Press:
- 02 October 2012, pp. 995-1009
- Print publication:
- October 2012
-
- Article
- Export citation