3 results
Observation and Analysis of an Electrically Active Layer at the Core-Shell Interface of a GaN Nanowire by Advanced Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1406-1407
- Print publication:
- July 2017
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The Application of Off-Axis Electron Holography to Electrically Biased Single GaN Nanowires for Electrical Resistivity Measurement
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1502-1503
- Print publication:
- August 2013
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Process Induced Extended Defects in SiC Grown via Sublimation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 742 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, K3.5
- Print publication:
- 2002
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