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Measuring Residual Stress on the Nanometer Scale - Novel Tools for Fundamental and Applied Research
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1424 / 2012
- Published online by Cambridge University Press:
- 10 February 2012, mrsf11-1424-ss11-02
- Print publication:
- 2012
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Interaction of Periodically Arranged Point Defects in a Two Dimensional Photonic Crystal -The Photonic Analogue to a Doped Semiconductor
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- Journal:
- MRS Online Proceedings Library Archive / Volume 797 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, W3.2
- Print publication:
- 2003
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Large-area porous alumina photonic crystals via imprint method
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- Journal:
- MRS Online Proceedings Library Archive / Volume 722 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, L5.2
- Print publication:
- 2002
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Investigations of Mesoscopic Ferroelectric Structures Prepared by Imprint Lithography
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- Journal:
- MRS Online Proceedings Library Archive / Volume 748 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, U4.2
- Print publication:
- 2002
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Porous Silicon from Hydrogenated Amorphous Silicon: Comparison with Crystalline Porous Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 452 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 403
- Print publication:
- 1996
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