Electron correlation microscopy (ECM) is a new technique that utilizes time-resolved coherent electron nanodiffraction to study dynamic atomic rearrangements in materials. It is the electron scattering equivalent of photon correlation spectroscopy with the added advantage of nanometer-scale spatial resolution. We have applied ECM to a Pd40Ni40P20 metallic glass, heated inside a scanning transmission electron microscope into a supercooled liquid to measure the structural relaxation time τ between the glass transition temperature T
and the crystallization temperature, T
. τ determined from the mean diffraction intensity autocorrelation function g
2(t) decreases with temperature following an Arrhenius relationship between T
+25 K, and then increases as temperature approaches T
. The distribution of τ determined from the g
2(t) of single speckles is broad and changes significantly with temperature.