The mechanical behavior of W/Cu multilayers with a period of 24 nm and a 1/3
W/Cu thickness ratio prepared by magnetron sputtering was analyzed using a
method combining X-ray diffraction and tensile testing. Tests were performed
both with a conventional and a synchrotron light source to analyze the
elastic response of the system. Comparison between the strain-load curves
obtained in both experimental conditions and estimated curves clearly shows
that high quality synchrotron measurements are a preliminary condition for
size-effect studies. Moreover, cyclic tests were used to determine the
elastic domain of each material and compare their mechanical responses.
Plastic strain was observed in copper while tungsten layers were still
elastically strained until cracks appeared.