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3 results

  • Towards sub-100-nm X-ray microscopy for tomographic applications

  • P. Bruyndonckx, A. Sasov, B. Pauwels
  • Journal:
    Powder Diffraction / Volume 25 / Issue 2 / June 2010
    Published online by Cambridge University Press:
    29 February 2012, pp. 157-160

  • We have demonstrated that structures down to 150 nm can be visualized in X-ray projection images using nanofocus X-ray sources. Due to their unlimited depth of focus, they do not possess a limit on the specimen size. This is essential for three-dimensional tomographic imaging of samples with a diameter larger than a few microns. Further simulation studies have shown that optimization of the detector response curve and switching from a reflective X-ray target to a transmission target should allow us to reach sub-100-nm resolutions.