The structure of γ/α interfaces in binary and Ta-containing TiAl alloys were analyzed by HRTEM and image simulations. Growth of α2 was found to be due to a ledge mechanism, consisting of Shockley partial dislocations on alternate (111)γ planes. The interface is atomically flat between the ledges and addition of Ta was found to transform arrays of growth ledges in the binary alloy into islands on the plate faces in the Ta-containing alloy. These islands of α2 on the γ/α2 interfaces were 4–7nm wide and increased in size with decreasing ageing temperature. The height of the ledges and islands were always a multiple of the c-parameter (0.46nm) of the α2 phase. The islands were bounded by 90°(edge) and 30° screw) Shockley partial dislocations. The 30° partial dislocation cores were localized whereas the 90° partial dislocation cores appeared to be highly delocalized due to presence of a high density of kinks, which in one case was found to be about 0.65nm−1.These results are interpreted in terms of the growth mechanisms and morphology of the α2 phase.