11 results
Every Atom has a Story to Tell: Using Single-Atom-Sensitivity Imaging and Spectroscopy to Determine Origins of Cosmic Nanodiamonds
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 866-867
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- July 2016
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Name that Atom in 60 Seconds or Less: Energy Dispersive X-Ray Spectroscopy of Individual Heteroatoms in Low Dimensional Materials
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1427-1428
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- August 2015
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Towards Automated Segmentation Methods for 3D Tomography Studies of the Morphology of Carbon Nanoglobules in Chondritic Meteorites
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2101-2102
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- August 2015
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Focused Ion Beam Direct Write Nanofabrication of Surface Phonon Polariton Metamaterial Nanostructures
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 358-359
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- August 2014
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Scanning Transmission Electron Microscopy (STEM) Tomography of Layer-by-Layer PAH/PSS-Au Nanocomposite Structures
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 1012-1013
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- July 2011
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Dislocation Nucleation and Growth in MOCVD GaN/AlN Films on Stepped and Step-free 4H-SiC Mesa Substrates
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- MRS Online Proceedings Library Archive / Volume 1090 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1090-Z05-24
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- 2008
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A Model for the Critical Height for Dislocation Annihilation and Recombination in GaN Columns Deposited by Patterned Growth
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- MRS Online Proceedings Library Archive / Volume 831 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, E11.29
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- 2004
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Ultraviolet-Assisted Pulsed Laser Deposition of Barium Strontium Titanate on Si: Characterization of the Interfacial Layer
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- MRS Online Proceedings Library Archive / Volume 718 / 2002
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- 01 February 2011, D7.14
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- 2002
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Characterization of the interfacial layer formed during pulsed laser deposition of oxides on Si
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- MRS Online Proceedings Library Archive / Volume 666 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, F11.4
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- 2001
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Application of ultraviolet radiation to minimize interfacial layer formation during the growth of alternate high-k gate dielectrics on Si
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- MRS Online Proceedings Library Archive / Volume 666 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, F8.11
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- 2001
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Characteristics of ultraviolet-assisted pulsed-laser-deposited Y2O3 thin films
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- Journal of Materials Research / Volume 15 / Issue 2 / February 2000
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- 31 January 2011, pp. 488-494
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- February 2000
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