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Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 6 / December 2011
- Published online by Cambridge University Press:
- 27 October 2011, pp. 983-990
- Print publication:
- December 2011
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- Article
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