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In-situ Transmission Electron Microscopy Study of the Impact of External Electric Field in 2D Perovskites
Romika Sharma, Linh Lan Nguyen, Qiannan Zhang, Tze Chien Sum, Martial Duchamp
Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
Published online by Cambridge University Press: 22 July 2022, pp. 846-848
Print publication: August 2022
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Operando and in situ in a TEM imaging in a cryogenic temperature range
Martial Duchamp, Joseph Vas, Reinis Ignatans, Aaron David Mueller, Rohit Medwal, Rajdeep Rawat, Vasiliki Tileli
Journal: Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
Published online by Cambridge University Press: 30 July 2021, pp. 386-387
Print publication: August 2021
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Investigation of the Oxidation Reaction of LiFePO4 Cathode Material using Environmental TEM
Matthieu Bugnet, Thierry Epicier, Martial Duchamp, Nadir Recham, Tristan Lombard, Christian Masquelier, Arnaud Demortière
Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
Published online by Cambridge University Press: 05 August 2019, pp. 1858-1859
Print publication: August 2019
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Denoising Electron-energy Loss Data Using Non-local Means Filters
Niklas Mevenkamp, Benjamin Berkels, Martial Duchamp
Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
Published online by Cambridge University Press: 04 August 2017, pp. 106-107
Print publication: July 2017
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Zig-zag Self-assembly of Magnetic Octahedral Fe3O4 Nanocrystals using in situ Liquid Transmission Electron Microscopy
Arnaud Demortiere, Charudatta Phatak, Andras Kovacs, Jan Caron, Nikita Repnin, Martial Duchamp, Nestor J. Zaluzec, Petr Kral, Igor S. Aranson, Rafal Dunin-Borkowski, Alexey Snezhko, Dean Miller
Journal: Microscopy and Microanalysis / Volume 22 / Issue S5 / November 2016
Published online by Cambridge University Press: 21 December 2016, pp. 36-37
Print publication: November 2016
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Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors
Knut Müller-Caspary, Florian F. Krause, Armand Béché, Martial Duchamp, Marco Schowalter, Stefan Löffler, Vadim Migunov, Florian Winkler, Martin Huth, Robert Ritz, Sebastian Ihle, Martin Simson, Henning Ryll, Heike Soltau, Lothar Strüder, Josef Zweck, Peter Schattschneider, Rafal Dunin-Borkowski, Johan Verbeeck, Andreas Rosenauer
Journal: Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
Published online by Cambridge University Press: 25 July 2016, pp. 484-485
Print publication: July 2016
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Three-dimensional Surface Charge Reconstructions of Surface Plasmon Modes of Silver Right Bipyramids
Sean M. Collins, Martial Duchamp, Emilie Ringe, Zineb Saghi, Paul A. Midgley
Journal: Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
Published online by Cambridge University Press: 23 September 2015, pp. 2225-2226
Print publication: August 2015
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Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope
Martial Duchamp, Qiang Xu, Rafal E Dunin-Borkowski
Journal: Microscopy and Microanalysis / Volume 20 / Issue 6 / December 2014
Published online by Cambridge University Press: 05 November 2014, pp. 1638-1645
Print publication: December 2014
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A procedure based on focused ion beam milling and in situ lift-out is introduced for the preparation of high-quality specimens for in situ annealing experiments in the transmission electron microscope. The procedure allows an electron-transparent lamella to be cleaned directly on a heating chip using a low ion energy and back-side milling in order to minimize redeposition and damage. The approach is illustrated through the preparation of an Al–Mn–Fe complex metallic alloy specimen.

Reflectance Improvement by Thermal Annealing of Sputtered Ag/ZnO Back Reflectors in a-Si:H Thin Film Silicon Solar Cells
Karin Söderström, Franz-Josef Haug, Céline Pahud, Rémi Biron, Jordi Escarré, Martial Duchamp, Rafal Dunin-Borkowski, Christophe Ballif
Journal: MRS Online Proceedings Library Archive / Volume 1321 / 2011
Published online by Cambridge University Press: 20 June 2011, mrss11-1321-a11-05
Print publication: 2011
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Silver can be used as the back contact and reflector in thin film silicon solar cells. When deposited on textured substrates, silver films often exhibit reduced reflectance due to absorption losses by the excitation of surface plasmon resonances. We show that thermal annealing of the silver back reflector increases its reflectance drastically. The process is performed at low temperature (150°C) to allow the use of plastic sheets such as polyethylene naphthalate and increases the efficiency of single junction amorphous solar cells dramatically. We present the best result obtained on a flexible substrate: a cell with 9.9% initial efficiency and 15.82 mA/cm2 in short circuit current is realized in n-i-p configuration.