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35 results

Page 1 of 2

  • Introduction of Advanced Electron Microscopy In-situ Techniques in CAMMA

  • Lichun ZHANG, Mark Aindow
  • Journal:
    Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
    Published online by Cambridge University Press:
    30 July 2020, pp. 1440-1441
    Print publication:
    August 2020
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  • In Situ Phase Transformation of Monodisperse Manganese Oxide Nanoparticles

  • Bahareh Deljoo, Steven L. Suib, Mark Aindow
  • Journal:
    Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
    Published online by Cambridge University Press:
    05 August 2019, pp. 1896-1897
    Print publication:
    August 2019
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  • FIB Milling strategies for TEM Sample Preparation of Spheroidal Powder Particles

  • Alexis Ernst, Mei Wei, Mark Aindow
  • Journal:
    Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
    Published online by Cambridge University Press:
    01 August 2018, pp. 826-827
    Print publication:
    August 2018
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  • A Comparison of Ga FIB and Xe-Plasma FIB of Complex Al Alloys

  • Alexis Ernst, Mei Wei, Mark Aindow
  • Journal:
    Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
    Published online by Cambridge University Press:
    04 August 2017, pp. 288-289
    Print publication:
    July 2017
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  • Studies of the Hierarchical Structure in UCT Manganese Oxides

  • Bahareh Deljoo, Tahereh Jafari, Steven L. Suib, Mark Aindow
  • Journal:
    Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
    Published online by Cambridge University Press:
    04 August 2017, pp. 1864-1865
    Print publication:
    July 2017
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  • Focused Ion Beam Preparation of Specimens for Micro-Electro-Mechanical System-based Transmission Electron Microscopy Heating Experiments

  • Sriram Vijayan, Joerg R. Jinschek, Stephan Kujawa, Jens Greiser, Mark Aindow
  • Journal:
    Microscopy and Microanalysis / Volume 23 / Issue 4 / August 2017
    Published online by Cambridge University Press:
    05 June 2017, pp. 708-716
    Print publication:
    August 2017

  • Micro-electro-mechanical systems (MEMS)-based heating holders offer exceptional control of temperature and heating/cooling rates for transmission electron microscopy experiments. The use of such devices is relatively straightforward for nano-particulate samples, but the preparation of specimens from bulk samples by focused ion beam (FIB) milling presents significant challenges. These include: poor mechanical integrity and site selectivity of the specimen, ion beam damage to the specimen and/or MEMS device during thinning, and difficulties in transferring the specimen onto the MEMS device. Here, we describe a novel FIB protocol for the preparation and transfer of specimens from bulk samples, which involves a specimen geometry that provides mechanical support to the electron-transparent region, while maximizing the area of that region and the contact area with the heater plate on the MEMS chip. The method utilizes an inclined stage block that minimizes exposure of the chip to the ion beam during milling. This block also allows for accurate and gentle placement of the FIB-cut specimen onto the chip by using simultaneous electron and ion beam imaging during transfer. Preliminary data from Si and Ag on Si samples are presented to demonstrate the quality of the specimens that can be obtained and their stability during in situ heating experiments.

  • Electron Microscopy Analysis of 17-4 PH Powder for Additive Manufacturing

  • Yu Sun, Mark Aindow, Rainer J. Hebert
  • Journal:
    Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
    Published online by Cambridge University Press:
    25 July 2016, pp. 1768-1769
    Print publication:
    July 2016
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  • In SituTEM Heating Experiments on PVP-Capped Silver Nano-Cubes

  • Sriram Vijayan, Sravan Thota, Jing Zhao, Mark Aindow
  • Journal:
    Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
    Published online by Cambridge University Press:
    25 July 2016, pp. 822-823
    Print publication:
    July 2016
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  • ALCHEMI Studies of Spinel Oxides for SOFC Interconnect Alloy Coatings

  • Louis V. Gambino, Neal J. Magdefrau, Mark Aindow
  • Journal:
    Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
    Published online by Cambridge University Press:
    23 September 2015, pp. 2277-2278
    Print publication:
    August 2015
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  • Analysis of Titanium Microalloying in As-Received and Oxidized Crofer® 22 APU

  • Louis Gambino, Neal Magdefrau, Mark Aindow
  • Journal:
    Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
    Published online by Cambridge University Press:
    27 August 2014, pp. 892-893
    Print publication:
    August 2014
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Page 1 of 2