16 results
Annular Dark-Field Imaging of Atomic Substitution in Single-Layer Materials
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 74-75
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- July 2010
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Uncovering Interface Structure by Column Shape Analysis in ADF STEM Images
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 108-109
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- July 2010
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Imaging of Light Atoms in the Presence of Heavy Atomic Columns
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 92-93
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- July 2010
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Interface Structure-Property Relations Through Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1420-1421
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- July 2010
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Atomic Resolution Mapping of Inequivalent O Sites in Complex Oxides
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 434-435
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- July 2009
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Direct Imaging of Light Elements in Aberration-Corrected Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1480-1481
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- July 2009
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The Treatment of Spatial Incoherence in the Aberration Corrected STEM
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1468-1469
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- July 2009
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Structural and Chemical Details of La05Sr0.5CoO3-δ Thin Films
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 440-441
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- July 2009
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Simulation of Atomic Resolution Images in STEM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 922-923
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- August 2008
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Simulating Atomic Resolution STEM Images of Non-Periodic Samples
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 928-929
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- August 2008
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Quantitative Image Contrast Variations in STEM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 942-943
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- August 2008
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Quantitative Image Simulation for Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 930-931
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- August 2008
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EELS imaging of oxygen vacancy ordering
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1354-1355
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- August 2008
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Image Formation Based on Atomic Resolution Core-loss Electron Energy Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1138-1139
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- August 2006
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3D Imaging with Single Atom Sensitivity using Confocal STEM
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1562-1563
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- August 2006
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Channeling Effects in High Angular Resolution Electron Spectroscopy
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1174-1175
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- August 2006
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