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Low Voltage STEM for the Study of Defects in 2D Materials
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1232-1233
- Print publication:
- August 2013
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Simulation Of Electron Energy Loss Near Edge Structure At Atomic Resolution For Aberration Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1490-1491
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- July 2012
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Single Atom Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 342-343
- Print publication:
- July 2012
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