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In order to deposit YBCO coated conductor with high critical current densities on rolling assisted biaxially textured Ni-W tapes, this paper has systematically studied the influence of deposition conditions on the orientation, in-plane texture and surface morphology of buffers and superconducting layers. It was found that the crystalline alignment and the in-plane texture of cerium oxide cap-layers were well improved by optimizing deposition parameters. The full width at half maximum of phi-scan x-ray diffraction peaks were reduced from original values of 7-8 degrees to 5-6 degrees. A high critical current density of 4.6×106 A/cm2 has been achieved on optimized buffer layers. This value is comparable with the critical current density of YBCO thin films deposited on single crystalline substrates.
Electron energy distribution function (EEDF) is directly proportional to the second derivative of the probe I-V characteristics. Because of an amplifying effect of unavoidable noises in the experimental probe I-V curves on the derivation process, the experimental I-V curves should be smoothed before performing the numerical derivation. This article investigates the effect of adjustable factors used in the smoothing process on the deduced second derivative of the I-V curves, and an optimum group of the adjustable factors is selected to make the rms deviation of the smoothed I-V curves from the measured ones less than 1 %. A simple differentiation circuit is designed and used to measure the EEDF parameter straightforwardly. It is the first time, so far as we know, to measure the EEDF parameters simultaneously by means of both numerical and circuit derivative methods under the same discharge conditions and on the same discharge equipment. The deviation between two groups of mean electron energy (E) and electron density (ne) obtained by the above different methods is within about 7 %. This apparently improves the reliability of the measurements on the EEDF parameters.
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