The electronic structure of the two organic, layered metals κ-ET2Cu(SCN)2 and K-ET 2Cu[N(CN)2]Br has been studied using a combination of soft X-ray emission (SXE) and soft X-ray absorption (SXA) spectroscopy. These techniques are powerful probes of the site and angular-momentum resolved partial density of states (PDOS) for both occupied and unoccupied states. Therefore these spectroscopies are particularly suited for an analysis of the density of states of multi-atomic, complex materials as the ET-based organic conductors, allowing site-specific electronic structure to be measured. Furthermore, for certain materials, the electronic structure of specific layers can be measured. We present a preliminary picture of the electronic structure of κ-ET 2Cu(SCN)2 and κ-ET 2Cu[N(CN)2]Br as measured by SXE and SXA performed at the C-Is and N- Is core levels.