Polycrystalline thin films of lithium manganese oxide have been grown using the pulsed-laser deposition (PLD) technique. Films of LiMnO2O4, were deposited onto Si substrates heated at temperature lower than 300°C from a sintered composite target (LiMn2O4+Li2O) irradiated with a Nd:YAG laser. The structural characterizations of these films have been carried out by Raman scattering spectroscopy which probe the local environment of cations in the LiMn2O4 framework. Raman spectra of PLD LiMn2O4 films have been investigated as a function of various growth conditions, i.e. substrate temperature, partial oxygen pressure in the deposition chamber, and target composition.