We have performed x-ray photon correlation spectroscopy (XPCS) measurements on a polymer-bilayer system comprised of 100 nm polystyrene film on top of an 80 nm polybromostyrene film, supported on a Si substrate. In order to distinguish the dynamics at the top interface from that at the polymer-polymer interface we have performed the measurement at grazing incidence. In this geometry, a standing wave is set up in the film. We derive a relation for the intensity of the standing wave and the resulting diffuse scattering. This model is compared with the measured diffuse scattering from which we extract a value of 0.7±0.4 dyne/cm for the surface tension between PS and PBrS at 180C. XPCS was then measured in each of two standing wave conditions, first where diffuse scattering only occurs at the polymer-vacuum interface and then where it only occurs at the interior polymer-polymer interface. The measured time correlation functions for each of the two interfaces show clear differences, with the polymer-polymer interface exhibiting much slower dynamics.