6 results
In-situ TEM imaging of Novel Edge Reconstruction in Bilayer Phosphorene
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2310-2311
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
In-situ Imaging of Anisotropic Layer-by-layer Phase Transition in Few-layer MoTe2
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2320-2322
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
Unidirectional Assembly on Distorted Two-Dimensional Crystal Substrates
-
- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 892-893
- Print publication:
- August 2021
-
- Article
-
- You have access
- Export citation
TEM Imaging of Edges and Point Defects in Monolayer Phosphorene
-
- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2348-2350
- Print publication:
- August 2020
-
- Article
-
- You have access
- Export citation
TEM Imaging and Electron Diffraction of Vertically Stacked Graphene/h-BN with Fine Control of Twist Angle
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2114-2115
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
Atomic-Resolution TEM Imaging of Phosphorene Protected by Graphene
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1696-1697
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation