Dark current-voltage characteristics of one hundred twenty single-junction a-Si:H alloy solar cells were studied. Parametric Modelling of dark I-V Measurements was used to determine some of the cell parameters. Average shunt resistances were 31 to 1200 kΩ for intrinsic layer thicknesses of 200 to 800 nm, respectively. Current switching was observed during dark I-V Measurements; the current in the reverse-bias region varies approximately as the square of the voltage following the onset of switching. The I-V characteristics in the switched mode are not understood. Voltage history and scan rate play a role in dark I-V characteristics.