Recently intense X-ray sources have been used in diffraction experiments on stress analysis, dynamical structure analysis, and so on. Since in these experiments one-dimensional position-sensitive X-ray detectors are very useful to reduce the measuring time, various kinds of X-ray detectors and processing systems have been developed. These detectors may be divided into two groups, the pulse type and the integral type. The pulse type employing either the charge division method, or the delay line method, processes each signal produced by an incident X-ray photon. To achieve a precise measurement, a sufficient gas gain and a relatively long processing time are needed. Therefore, the maximum counting rate depends on both detector characteristics and a signal processing time. On the other hand, the integral type, such as self-scanning photodiode array detectors (1, 2) periodically processes the charges produced by X-rays in each pixel. The total maximum counting rate of the detector is the sum of the maximum counting rate of each pixel and is higher than that of the pulse type.