3 results
Energy Selected Secondary Electron Image Revealing Surface Potential by High Accelerating Voltage Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1514-1515
- Print publication:
- August 2018
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Strain Analysis of FinFET Device Utilizing Moiré Fringes in Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 978-979
- Print publication:
- August 2018
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Way to Reduce Electron Dose in Pseudo Atomic Column Elemental Maps by 2D STEM Moire Method
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1790-1791
- Print publication:
- July 2017
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