Rigorous coupled wave analysis (RCWA) simulation was used to model the absorption in periodic arrays of GaAs0.73P0.27 nanowires (NWs) on Si substrates dependent upon the diameter (D), length (L), and spacing (center-to-center distance, or pitch, P) of the NWs. Based on this study, two resonant arrangements for a top NW array sub-cell having the highest limiting short-circuit current densities (Jsc) were found to be close to D = 150 nm, P = 250 nm and D = 300 nm, P = 500 nm, both featuring the same packing density of 0.28. Even though a configuration with thinner NWs exhibited the highest Jsc = 19.46 mA/cm2, the array with D = 350 nm and P = 500 nm provided current matching with the underlying Si sub-cell with Jsc = 18.59 mA/cm2. Addition of a rear-side In0.81Ga0.19As nanowire array with D = 800 nm and P = 1000 nm was found to be suitable for current matching with the front NW sub-cell and middle Si. However, with thinner and sparser In0.81Ga0.19As NWs with D = 700 nm and P = 1000 nm, the Jsc of the bottom sub-cell was increased from 17.35 mA/cm2 to 18.76 mA/cm2 using a planar metallic back surface reflector, thus achieving a current matching with the top and middle cells.

Alternate aluminum and arsenic precursors were investigated for InAlAs grown by organometallic vapor phase epitaxy (OMVPE). The quality of the InAlAs growths was investigated by secondary-ion mass spectrometry (SIMS) to measure impurity concentrations. Trends are extracted from SIMS measurements for each precursor as a function of V/III ratio and growth temperature. Two arsenic precursors, arsine and tertiarybutylarsine (TBAs), were chosen to compare InAlAs growth quality. The impurity concentrations measured by SIMS decrease as the V/III ratio increases, for both arsine and TBAs growths. Impurities also decrease as growth temperature increases. Two aluminum precursors, trimethylaluminum (TMAl) and tritertiarybutylaluminum (TTBAl), were used to compare the effect of alumimum precursor on carbon and oxygen impurity levels. TMAl is widely studied in literature, though TTBAl is less common. This study represents the first report using the TTBAl precursor for InAlAs growth. Each aluminum source is used in conjunction with each aforementioned arsenic precursor in order to compare all possible precursor combinations. TMAl growths demonstrated decreasing impurities with increasing V/III ratio. TTBAl growths did not exhibit such a dependence, impurity concentrations remained virtually constant regardless of V/III ratio.

The insertion of nanostructured materials (such as quantum wells, wires, and dots) into the intrinsic region of p-i-n solar cells introduces an intermediate band within the bandgap of the host material. It has been shown that the sub-bandgap conversion provided by the nanostructured materials, enhances the short circuit current as well as the overall efficiency of InAs quantum dots (QD) imbedded in GaAs superlattice (SL) solar cells [1]. As a contender for space applications, it is necessary to subject these solar cell structures to temperatures encountered in the Low Earth Orbit (LEO), probing for any material degradation. Herein, we focus on temperature dependent characterization using high resolution X-ray diffraction (HRXRD) of InAs QD enhanced GaAs solar cell structures with varying growth parameters. The structures characterized can be classified into three groups: (1) GaP strain compensation coverage, (2) GaAs barrier coverage, and (3) InAs coverage for QD formation. HRXRD rocking curves of each structure focusing around the GaAs peak are analyzed at a range of temperatures up to 200˚C. Although no noticeable shifts in the SL peaks are detected, interfacial diffusion decreased the resolution of fringes produced by reflections at the SL interfaces in test structures with varying InAs QD coverage. Unbalanced strain in the same structures shows a distortion in the GaAs peaks.

This article describes a number of velocity-based moving mesh numerical methods for multidimensional nonlinear time-dependent partial differential equations (PDEs). It consists of a short historical review followed by a detailed description of a recently developed multidimensional moving mesh finite element method based on conservation. Finite element algorithms are derived for both mass-conserving and non mass-conserving problems, and results shown for a number of multidimensional nonlinear test problems, including the second order porous medium equation and the fourth order thin film equation as well as a two-phase problem. Further applications and extensions are referenced.

This research investigates the potential of pulsed laser deposition to create reliable high current ohmic contacts of Ni2Si on single crystal 4H-SiC. Since this stoichiometry is the stable interphase in the nickel-silicon carbide diffusion couple, direct deposition eliminates the detrimental excess carbon normally formed by direct sintering Ni on SiC, the surface roughening that results from this sintering as well as the need for post-deposition high-temperature (900°C) anneals that are required in complex multi-component contacts. This study examines the processing parameters that must be used during deposition to obtain the desired microstructural characteristics for the contact. Pulsed laser deposition of nickel silicide produces smooth films with an amorphous or nanocrystalline structure interspersed with macroparticles. Macroparticle formation on the resulting films appear in the form of solidified droplets of the eutectic composition nickel silicide (3:1) that form during the long term target processing. The dependence of the number and size distributions of these droplets on laser fluence sample temperature is examined.

Pulsed laser direct deposit Ni2Si Ohmic contacts were successfully fabricated on n-SiC. The electrical, structural, compositional, and surface morphological properties were investigated as a function of heat treatments ranging from 700 °C to 950 °C. The as-deposited and 700 °C annealed samples were non-Ohmic. Annealing at 950 C° yielded excellent Ohmic behavior, an abrupt void free interface, and a smooth surface morphology. No residual carbon was present within the contact film or at the film-SiC interface and the contact showed no appreciable contact expansion as a result of the 950 °C annealing process. Results of this investigation demonstrate that 950 °C annealed pulse laser deposited Ni2Si-SiC contacts possess excellent electrical, interfacial, microstructural, and surface properties, which are required for reliable device operation.

In this paper, we report on the fabrication and characterization of pure and Al doped Ta2O5 thin films fabricated by metalorganic solution deposition (MOSD) technique. The pure and Aldoped Ta2O5 thin films were fabricated by spin-coating technique using room temperature processed carboxylate-alkoxide precursor solution. The structure of the films was analyzed by xray diffraction (XRD). The surface and cross-sectional morphology of the films were examined by field emission scanning electron microscope (FESEM) and atomic force microscope (AFM). The electrical measurements were conducted on films in MIM configuration using Pt as the top and bottom electrode. The effects of Al concentration and the post-deposition annealing temperature on the structural, dielectric, and insulating properties were analyzed. The effects of the applied bias and the measurement temperature on the dielectric and insulating properties were also analyzed to establish the stability and reliability of Al doped Ta2O5 thin films.

Thin films of (Y0.92Eu0.08)2O3 were synthesized through chemical vapor deposition of β-diketonate precursors onto glass and sapphire substrates. The films were weakly luminescent in the as-deposited condition and were composed of spherical particles 3 μm in diameter. A KrF laser was pulsed for 25 ns from 1–3 times on the surface of the films. One pulse was sufficient to melt the film and repeated pulses caused ablation of the material. Melting of the film smoothed the surface, increased the density, and increased the photoluminescent emission intensity.

The XIA DXP-4C is a 4 channel, CAMAC based, x-ray spectrometer which digitally processes directly digitized preamplifier signals. The DXP-4C was designed for instrumenting multi-detector arrays for synchrotron radiation applications, and optimized for very high count rates at a low cost per detector channel. This produced a very compact and low power (3.4 W/channel) instrument for its count rate and MCA capabilities, which thus provides a strong basis for portable applications. Because all functions are digitally controlled, it can be readily adapted to various user interfaces, including remote access interfaces. Here we describe the design and examine approaches to lowering its power to 50 mW/channel. We then consider the issues in applying it to three typical portable or remote spectrometry applications.

Late-summer subglacial water pressures have been measured in a dense array of boreholes in the ablation area of Haut Glacier d’Arolla, Switzerland. Interpolated surfaces of minimum diurnal water pressure and diurnal water-pressure variation suggest the presence of a subglacial channel within a more widespread, distributed drainage system. The channel flows along the centre of a variable pressure axis (VPA), some tens of metres wide, that is characterized by low minimum diurnal water pressures (frequently atmospheric) and high diurnal water-pressure variations. These characteristics are transitional over a lateral distance of c. 70 m to higher and more stable subglacial water pressures in the adjacent distributed system. Water-pressure variations recorded in boreholes located close to the centre of the VPA reflect the delivery of surface-derived meltwater to the glacier bed and result in a diurnally reversing, transverse hydraulic gradient that drives water out from the channel into the distributed system during the afternoon and back to the channel overnight. Subglacial observations suggest that such flow occurs through a vertically confined sediment layer. Borehole turbidity records indicate that the resulting diurnal water flows are responsible for the mobilization and transport of fine debris in suspension. Analysis of the propagation velocity and amplitude attenuation cf the diurnal pressure waves suggests that the hydraulic conductivity of the sediment layer decreases exponentially with distance from the channel, falling from c. 10−4 m s−1 at the channel boundary to c. 10−7 m s−1 70 m away. These apparent hydraulic conductivities are consistent with Darcian flow through clean sand and typical glacial till, respectively.

We suggest that fine material is systematically flushed from basal sediments located adjacent to large, melt-season drainage channels beneath warm-based glaciers. This process may have important implications for patterns of glacier erosion, hydro-chemistry and dynamics.