10 results
Near Edge Fine Structure Analysis of Copper in Cu-Bi2Se3 Topological Insulators
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 160-161
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- August 2014
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Time-Resolved Spectra from Millivolt EELS Data
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- Microscopy and Microanalysis / Volume 20 / Issue 3 / June 2014
- Published online by Cambridge University Press:
- 30 May 2014, pp. 837-846
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- June 2014
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Microstructures induced by femtosecond laser pulses inside glasses
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- Journal of Materials Research / Volume 24 / Issue 6 / June 2009
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1983-1988
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- June 2009
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Quantitative Convergent Beam Electron Diffraction Measurements of Low-Order Structure Factors in Copper
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- Microscopy and Microanalysis / Volume 9 / Issue 5 / October 2003
- Published online by Cambridge University Press:
- 16 September 2003, pp. 379-389
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- October 2003
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Introduction: A Special Issue on Electron Diffraction
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- Microscopy and Microanalysis / Volume 9 / Issue 5 / October 2003
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- 16 September 2003, pp. 377-378
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- October 2003
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A Quantitative Nanodiffraction System for Ultrahigh Vacuum Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 9 / Issue 5 / October 2003
- Published online by Cambridge University Press:
- 16 September 2003, pp. 468-474
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- October 2003
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On the Consistency of QCBED Structure Factor Measurements for TiO2 (Rutile)
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- Microscopy and Microanalysis / Volume 9 / Issue 5 / October 2003
- Published online by Cambridge University Press:
- 16 September 2003, pp. 457-467
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- October 2003
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Low-Dose, Low-Temperature Convergent-Beam Electron Diffraction and Multiwavelength Analysis of Hydrocarbon Films by Electron Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue 5 / October 2003
- Published online by Cambridge University Press:
- 16 September 2003, pp. 428-441
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- October 2003
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New Tools for Imaging, Spectroscopy and Diffraction from Nanostructures
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- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 58-59
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- September 2003
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Transmission Electron Diffraction at 200 eV and Damage Thresholds below the Carbon K Edge
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue 4 / July 2000
- Published online by Cambridge University Press:
- 07 August 2002, pp. 368-379
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- July 2000
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