6 results
Use Electrons Sparingly but Efficiently, the Battle to get All the Required Information Needed While Minimizing Dose and Maximizing Data Collection at the Highest Resolution
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 54-55
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- July 2016
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High Performance in Low Voltage HR-STEM Applications Enabled By Fast Automatic Tuning of the Combination of a Monochromator and Probe Cs-Corrector
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 980-981
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- July 2016
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Towards Quantitative EDX Results in 3 Dimensions
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 766-767
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- August 2014
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Live Imaging of Reversible Domain Evolution in BaTiO3 on the Nanometer Scale Using in-situ STEM and TEM
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1560-1561
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- August 2014
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Energy Contrast from Si Low Loss at 74 eV for Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 22 July 2003, pp. 490-491
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- August 2003
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Further Applications of Energy Filtered TEM in Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 626-627
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- August 2002
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