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Light emission excited by scanning tunnelling microscopy (STM) has been observed on multiwall
carbon nanotubes. The photon yield depends on the scanned tube but it is constant all along the tube.
Simultaneous photon spectroscopy evidences emitted wavelengths in the 600−1000 nm range in good
agreement with previous field emission data. Emission characteristics are independent of substrate and of STM tip. We discuss how these new results are consistent with radiative transitions involving localized
states in carbon nanotubes.
The magnetic properties of carbon-coated Co and Ni nanoparticles aligned in chains were determined using transmission electron holography. The measurements of the phase change of the electron wave due to the magnetization of the sample were performed. The ratio of remnant magnetization to bulk saturation magnetization Mr/Ms of Co decreased from 53% to 16% and of Ni decreased from 70% to 30% as the particle diameter increased from 25 to 90 nm. It was evident that the inhomogenous magnetic configurations could diminish the stray field of the particles. After being exposed to a 2-Tesla external magnetic field, the Mr/Ms of Co increased by 45% from the original values with the same dependency on the particle size. The Mr/Ms of Ni particles, on the other hand, increased only 10%. The increased magnetization could be attributed to the merging of small domains into larger ones after the exposure to the external magnetic field. The validity of the interpretation of the holograms was established by simulation.
InxGa1−xAs epilayers grown on GaAs(100) were studied by cathodoluminescence (CL) spectroscopy and imaging technique with 0.8 nm spectral resolution, using a transmission electron microscope. Linear features appear in the monochromatic CL image taken by the emission from the InxGa1−x.As layers, and do not appear in those from the GaAs layers. There is no direct correlation between the dark-line contrast in the panchromatic CL image (due to misfit dislocations) and the strong line contrast in the monochromatic CL images of the InxGa1−xAs layers. A peak wavelength shift in the CL spectrum was observed as the electron probe was moved across the linear features. The linear features also appear in a thin sample where the misfit dislocations are removed by ion milling, which clearly reveals that the strong line contrast is not directly due to the misfit dislocation. From those results the linear features in the monochromatic CL image are considered to be due to compositional fluctuations of the In concentration in the InxGa1−xAs layer.
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