We show the approaches in achieving high resolution Raman and white light imaging. In Raman imaging, a dielectric microsphere is trapped by the incoming laser, which was focused onto the sample by the microsphere. The microsphere was also used to collect the scattered Raman signals. We show the capability of this method in imaging various types of samples, such as Si devices and gold nanopattern. This method is comparatively easier to perform, better repeatability, and stronger signal than the normal near-field Raman techniques. Besides the Raman imaging, we also show a far-field confocal white light reflection imaging system that can be used for the fast imaging and characterization of nanostructures. This system uses a xenon (Xe) lamp as the incident light source and tunable aperture to enhance the spatial resolution. It has a spatial resolution of around 370 nm at a wavelength of 590 nm. With our system, we can clearly resolve images of 300 nm nanoparticles arranged in 2D honeycomb arrays with a period of 500 nm. Localized surface plasmons (LSPs) of isolated single and dimer gold nanospheres were also studied and the resonance energy difference between their LSPs was extracted.