New methods for modeling oxide film growth using MD (molecular dynamics) simulations are explored in order to study the atomic mechanism of the self-healing oxidation phenomenon in metal/oxide systems. A modified MEAM (modified embedded atom method) potential is proposed and extended by a variable charge ionic potential model from the literature, for which the PPPM (particle-particle-particle-mesh) was used as Coulomb solver. In this work the first results are reported. The ionic potential model is tested in combination with the PPPM solver. The results are excellent.