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An automated technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope (TEM) is briefly described. It is primarily based on the projected reciprocal lattice geometry that is extracted automatically from precession electron diffraction (PED) enhanced spot patterns. The required hardware allows for a scanning-precession movement of the primary electron beam on the crystalline sample and can be interfaced to any newer or older mid-voltage TEM. Comprehensive open-access crystallographic databases that may be used in support of this technique are mentioned.

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Characterization of Porous, TiO2 Nanoparticle Films Using On-Axis TKD in SEM -a New Nano-Analysis Tool for a Large-Scale Application

Utility of Precession Electron Diffraction Patterns with Varying Degrees of Non-parallel Illumination from the Same Nominal Sample Area

Automated Crystallite Orientation and Phase Mapping in a Transmission Electron Microscope

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3 results

Characterization of Porous, TiO2 Nanoparticle Films Using On-Axis TKD in SEM -a New Nano-Analysis Tool for a Large-Scale Application

Utility of Precession Electron Diffraction Patterns with Varying Degrees of Non-parallel Illumination from the Same Nominal Sample Area

Automated Crystallite Orientation and Phase Mapping in a Transmission Electron Microscope