We successfully observed electron emission from hydrogenated diamond (111) p+-i-n+ junction diodes. Here, p+- and n+-layers mean that the boron and phosphorous impurity concentrations in these layers are around 1020 cm-3. Then the p+-layer on top of the diode suppresses electron emission from the top-surface area. The heavily doped layers also play an important role to obtain high diode and emission currents. The emission started when the applying bias voltage was equal to the built-in potential, and the emission current reached to over 1 μA at room temperature operation. With taking into account our previous photoemission yield spectroscopy results and with the very high binding energy of free excitons of 80 meV in diamond, we suggested that the electron emission was derived from free excitons generated in the i-layer of the diodes.

Phosphorus doping on (001)-oriented diamond is introduced and compared with results achieved on (111) diamond. Detailed procedures, conditions, doping characteristics, and recent electrical properties of (001) phosphorus-doped diamond films are described. Now the highest mobility is reached to be ∼780 cm2/Vs at room temperature. The carrier compensation ratio, which is still high around 50-80 %, is the most important issues for (001) phosphorus-doped diamond to improve its electrical property. The origin of compensators in phosphorus-doped diamond is investigated, while yet to be identified.

Ultraviolet light emitting diode with p-i-n junction structure is also introduced using (001) n-type diamond. A strong UV light emission at around ∼240 nm is observed even at room temperature. High performance of diamond UV-LED is demonstrated.