7 results
Atomic-scale Mechanisms of Defect-Induced Retention Failure in Ferroelectric Materials
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1307-1308
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- August 2015
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Unit-cell Scale Measurements of Oxygen Vacancy Concentration and Homogeneity in SOFC Cobaltite Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1310-1311
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- July 2012
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Characterizing the Two- and Three-Dimensional Resolution of an Improved Aberration-Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue 5 / October 2009
- Published online by Cambridge University Press:
- 16 September 2009, pp. 441-453
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- October 2009
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Surface stability of epitaxial SrRuO3 thin films in vacuum
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- Journal of Materials Research / Volume 19 / Issue 12 / December 2004
- Published online by Cambridge University Press:
- 01 December 2004, pp. 3447-3450
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- December 2004
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Chemical solution deposition of lanthanum zirconate barrier layers applied to low-cost coated-conductor fabrication
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- Journal:
- Journal of Materials Research / Volume 19 / Issue 7 / July 2004
- Published online by Cambridge University Press:
- 03 March 2011, pp. 2117-2123
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- July 2004
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Nanoscale Analysis of Complex Oxide Interfaces
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 822-823
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- August 2003
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Controlled deposition of wedge-shaped profiles for thin (∼10Å) layers by pulsed laser deposition
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- Journal:
- MRS Online Proceedings Library Archive / Volume 804 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, JJ8.4
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- 2003
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