The formation of the silicide MnSi1.7 by reactive deposition of Mn onto Si(001) has been studied using Sb as a surfactant. The growth was performed under UHV conditions by simultaneous or consecutive exposure of the Si substrates, held at high temperatures (550°C, 600 °C), to a flux of Sb and Mn atoms. The presence of Sb during the growth strongly increases the island density and changes the crystalline orientation of the MnSi1.7 grains. The morphology and the orientation of the resulting silicide are the same both for the deposition of Mn on a Sb terminated Si(001) surface and for the co-deposition of Mn and Sb on Si(001). A residual Sb coverage close to one monolayer (ML) at the sample surface has been determined for both of the preparation modes at Tsub = 550 °C. The transition from the growth mode without Sb to the surfactant-controlled growth has been studied for Tsub = 600 °C. It has been found that the silicide morphology and orientation strongly depend on the thickness of Sb pre-coverage, which was increased from 0 to about 0.7 ML (1 ML = 6.78·1014 atoms cm-2).