The highest efficiency CuIn1-xGaxSe2 (CIGS) based solar cells have been produced from films with x∼0.3 which gives a value of Eg around 1.1-1.2eV. Increasing the Ga content of the CIGS absorber provides an increase in Voc, allows tuning of the band gap that can enhance performance under actual operating conditions, and potentially makes it possible to use CIGS films in multi-junction devices. However, champion cells have not yet been produced for values of x significantly greater than 0.3. This work focuses on how increased Ga content in CIGS films affects the recombination behavior of grain boundaries. Cathodoluminescence spectral imaging (CLSI) measurements on fully processed devices allow us to compare device properties with recombination behavior and optical properties of grain boundaries in films with different Ga content. Our data suggests that grain boundaries in high efficiency films with x∼0.3 exhibit a significant red shift in the CL spectra whereas grain boundaries in films with higher Ga content typically show either a small shift or none at all. This shift indicates band bending near the boundaries which could enhance charge separation and subsequent collection of carriers generated near grain boundaries. This is investigated statistically to identify trends in different regions of the films.