Films of SrBi2Ta2O9 (SBT) were grown on Pt/TiO2/SiO2/Si substrates by the pulsed laser deposition (PLD) technique. The deposits were made at temperatures between 570°C and 715°C, and post-annealed at 750°C. The films grown at 610°C show a (115) preferentially orientation with a small peaks associated to (00l) planes. At higher deposition temperatures, the (00l) peaks increase their intensity, a tendency that is intensified after the heat treatment at 750°C. However, when the films grown at 590–610°C are heat-treated at 750°C, there is a reduction of the crystallites oriented in the (00l) direction, leading to an enhancement of the polarization, reflected in the maximum value of 2P
= 9.1 μC/cm2 and a coercive field, E
, of 52.0 KV/cm.