Scanning stage microscopes have traditionally been used to provide high resolution, large area photocurrent mapping of solar cells and detectors. This imaging method, while very useful in the characterization and quality control of solar cells, is unfortunately slow (image acquisition takes several minutes). This paper describes a confocal scanning beam MACROscope-Microscope which can image specimens from 25×25 μm up to 7.5×7.5 cm in size, a zoom factor of 3000, using reflected light, photoluminescence, and optical beam induced current in less than 10s. Resolutions range from 0.25 to 10 μ;m laterally and 0.5 to 300 pm axially depending upon whether microscope or MACROscope mode is used. This instrument can therefore be used to characterize and provide quick and efficient quality control for solar cells and detectors at a microscopic and macroscopic level.
A brief description of the MACROscope-Microscope is given. The MACROscope- Microscope's many abilities are highlighted by showing various reflected-light, photolhminescence and optical beam induced current images from CdZnS/CulnSe2 thin film solar cells and porous silicon devices.