11 results
Fast Solid-state Segmented Detectors: Improvements and Implications for DPC-STEM
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2486-2487
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- August 2022
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In-Situ EBIC STEM: Automated Quantification
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1718-1719
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- August 2022
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Quantitative Image Format for Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1176-1178
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- August 2020
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New Developments and Applications of Electron Beam Absorbed Current in SEM
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 532-533
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- August 2019
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Reduce Charging Effects on Beam Sensitive Material by Optimized Scanning Routines in SEM
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 474-475
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- August 2019
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The ESEM as In Situ Platform for the Study of Gas-Solid Interactions
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 344-345
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- August 2018
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Live Quantitative BSE Acquisition with Standard-less Calibration
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 654-655
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- August 2018
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New Possibilities for State-of-the-Art Electron Microscopy with Fast Backscattered Electron Detectors
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 650-651
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- August 2018
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High-Temperature BSE and EBAC Electronics for ESEM
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 694-695
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- August 2018
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A Robust 3D Scanning Technique for SEM
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 356-357
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- July 2017
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Cryogenic FIB Lift-out as a Preparation Method for Damage-Free Soft Matter TEM Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1224-1225
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- August 2014
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