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Electron Channeling Contrast Imaging for Non-Destructive Analysis of Extended Defects in Semiconductor Thin Films and Device Structures
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1064-1065
- Print publication:
- August 2014
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- Article
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Fabrication Methods for Au Nanocluster Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 582 / 1999
- Published online by Cambridge University Press:
- 21 March 2011, H12.5
- Print publication:
- 1999
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- Article
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