We describe how a commercial silicon cantilever can be used both as a force probe and a
local scatterer of light. This tip can thus be used as the key element of an apertureless
Scanning Near-field Optical Microscope (SNOM) combined with an Atomic Force
Microscope (AFM). We use a Total Internal Reflection (TIR) illumination to provide a
Fresnel evanescent wave with well-defined characteristics. We show how the weak signal
issued from the near-field scattered by the tip can be extracted from the background noise.
Finally we present how a signal related to the near field can also be obtained when the tip is
oscillated at a frequency close to the resonance frequency of the cantilever. These results are
compared with a simulation of the lock-in detection. Finally we describe the role of the
vibration amplitude on the signal.