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Infrared and Visible Emission from Si Layers
A. Kux, P. Lugli, R. Ostermeir, F. Koch, G. Deboy
Journal: MRS Online Proceedings Library Archive / Volume 256 / 1991
Published online by Cambridge University Press: 15 February 2011, 223
Print publication: 1991
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We present an experimental study of light emission in silicon devices, mainly MOSFETs, p-i-n diodes, and MIS structures. The special analysis shows important features below as well as above the gap, indicating the type of mechanism responsible for the light emission. Striking differences we found between planar and vertical-type structures.