25 results
Physical and Practical Challenges in Analytical Electron Tomography of Aluminum Alloys
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 1521-1522
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- August 2015
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What Does Quantitative Mean In Atomic-Resolution EDS STEM?
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 1075-1076
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- August 2015
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Quantitative EDX and EELS Elemental Mapping at Atomic Resolution
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 570-571
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- August 2014
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Fast STEM EELS Spectrum Imaging analysis of Pd-Au based catalysts
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 1612-1613
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- August 2013
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EDX and EELS Chemical Analysis with a Probe Corrected STEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 972-973
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- July 2012
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EELS & EFTEM Imaging: Instrumentation, Applications and Artifacts
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1946-1947
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- July 2010
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Hyperspectral Imaging in TEM: New Ways of Information Extraction and Display
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 70-71
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- August 2008
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Low-loss EELS Measurements with Monochromated Electrons
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- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
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- 07 September 2007, pp. 46-47
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- September 2007
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A Comparison of the Electronic Structure of N-K in TiN and VN using EELS and Ab-initio Calculations
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- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 414-415
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- September 2007
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Applied Nanoanalysis by Electron Energy-Loss Spectrum Imaging Methods
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- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
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- 07 September 2007, pp. 432-433
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- September 2007
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Automated EFTEM Spectrum Image Acquisition: Overcoming EELS Dynamic Range Problems
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 156-157
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- August 2007
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Lifetime of Hot Electrons in Metals Retrived From Low Loss EELS
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1168-1169
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- August 2006
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Electron Energy-Loss Spectroscopy with a Monochromated TEM
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1146-1147
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- August 2006
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STEM- and EFTEM-Analysis of Nanomaterials at High Spatial and High Energy Resolution
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 1436-1437
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- August 2005
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0.60 eV Energy Resolution in EELS Using a Depleted Thermionic LaB6-Cathode
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 712-713
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- August 2005
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EELS Spectrum Imaging: The Next Steps
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 34-35
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- August 2005
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New Developments in Energy-filtering Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 48-49
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- August 2005
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Analytical Electron Microscopy in Materials and Biological Sciences
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- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
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- 05 September 2003, pp. 12-13
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- September 2003
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Comparative Electron Energy-Loss Near-Edge Fine Structure Investigations Of Titanium Oxides
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 01 August 2003, pp. 834-835
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- August 2003
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Experiencies and Possibilities with a 200 kV Monochromated (S)TEM
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 24 July 2003, pp. 846-847
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- August 2003
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