In this work we studied a set of nominally undoped epitaxial InxGa1−xN wurtzite films grown on (0001) sapphire substrates. In order to separate the contribution of the strain and indium content in the phonon mode frequency, indium mole fraction was determined using a strain insensitive method, Rutherford backscattering spectrometry (RBS). Strain was evaluated by comparing the lattice constants measured by X-ray diffraction (XRD) with the relaxed lattice parameters given by Vegard's law. Samples with comparable indium content, but under different states of strain were used as reference. This allowed the behaviour of different Raman shift modes for both, strain and composition to be independently established. We also assess the potentiality of Raman spectroscopy for the evaluation of crystalline quality by comparing the results obtained with the ones provided by other well-established methods such as XRD and RBS.