Many electron devices and chemical reactions depend on the escape rate of particles confined by potential wells. When the diffusion coefficient of the particle is small, the carrier continuity or the Smoluchowski equation is used to study the escape rate. This equation includes diffusion and field-aided drift. In this work solutions to the Smoluchowski equation are probed to show how the escape rate depends on the potential well shape and well depth. It is found that the escape rate varies by up to two orders of magnitude when the potential shape differs for a fixed well depth.