Bi single crystals have been implanted with isoelectronic ions (As, Sb and Bi) and the electronic structur of these implanted materials has been studied using the magnetoreflection technique. Since the ion penetration depth and optical skin depths are of roughly the same magnitude, this technique provides a sensitive test for implantation-induced changes in the electronic structure. Explicitly, the magnetoreflection spectra show changes in lineshape, resonant frequency and in some cases the introduction of Landau level transitions forbidden in unimplanted bismuth. In particular, implantation-induced changes in the resonance lineshapes indicate an increase in plasma frequency as either the fluence of the implants or the ion size is increased. Further analysis of the data shows that the Lax model, which accounts for the magnetoreflection spectra of unimplanted bismuth, is equally applicable to bismuth implanted with isoelectronic ions. Our results yield measurable changes in the L-point band gap and smaller relative changes in the band parameter combination Eg/m* . The mechanism responsible for these changes in the electronic structure of bismuth is suggested.