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Correlative Atom Probe Tomography and Transmission Electron Microscopy Analysis of Grain Boundaries in Thermally Grown Alumina Scale
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue 1 / February 2019
- Published online by Cambridge University Press:
- 04 February 2019, pp. 11-20
- Print publication:
- February 2019
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- Article
- Export citation