The need to understand fast, complex physical phenomena through direct in
situ observation has spurred the development of
high-time-resolution transmission electron microscopy (TEM). Two complementary
approaches have emerged: the single-shot and stroboscopic techniques.
Single-shot TEM has advanced through the development of dynamic transmission
electron microscopy (DTEM) and, more recently, by the advent of movie-mode DTEM,
which enables high-frame-rate in situ TEM experimentation by
capturing nanosecond-scale sequences of images or diffraction patterns. Previous
DTEM studies produced only single snapshots of fast material processes.
Movie-mode DTEM provides the ability to track the creation, motion, and
interaction of individual defects, phase fronts, and chemical reaction fronts,
providing invaluable information on the chemical, microstructural, and
atomic-level features that govern rapid material processes. This article
discusses movie-mode DTEM technology, its application in the study of reaction
dynamics in Ti–B-based reactive nanolaminates, and future