36 results
Correlative Analysis in the Semiconductor Industry
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2502-2503
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- August 2019
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Reconstruction Metrics in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 336-337
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- August 2019
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Focused Ion Beam Fabrication of Solidified Ferritin into Nanoscale Volumes for Compositional Analysis Using Time-of-Flight Mass Spectrometry Methods
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1860-1861
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- July 2010
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Multivariate Statistical Analysis of Atom Probe Tomography Data
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 270-271
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- July 2010
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Looking Inside the Fascinating Nanoworld Controlling Light Emission from InGaN/GaN Quantum Well Devices
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1890-1891
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- July 2010
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Optimized Laser Thermal Pulsing of Atom Probe Tomography: LEAP 4000X™
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 10-11
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- July 2010
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Wide-Field-of-View Atom Probe Reconstruction
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 292-293
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- July 2009
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TEM and Atom Probe Tomography Characterization of High TMR MgO-Based Magnetic Tunnel Junctions
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 278-279
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- July 2009
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Background Removal Methods Applied to Atom Probe Data
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 256-257
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- July 2009
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Backside Lift-Out Specimen Preparation: Reversing the Analysis Direction in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 298-299
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- July 2009
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Cluster Detection and Quantification
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 252-253
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- July 2009
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Pre-sharpened Microtips: An Efficient Sample Preparation Method for Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 296-297
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- July 2009
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Evaluation of Local Radii of Atom-Probe-Tomography Specimens
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 248-249
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- July 2009
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Improvements in Three-Dimensional Compositional Analysis of Complex Alloys
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 294-295
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- July 2009
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A System for Simulation of Tip Evolution Under Field Evaporation
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 302-303
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- July 2009
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Development of Atom Probe Tomography for Biological Materials
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 582-583
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- July 2009
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Tomographic Reconstruction in Atom Probe Microscopy: Past, Present. . . Future?
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 10-11
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- July 2009
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Nanoscale Microstructure in a Titanium Aluminide Alloy
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 284-285
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- July 2009
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Analysis of Bulk Dielectrics with Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1254-1255
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- August 2008
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Advantages of Using a Digital Detector for Field Ion Microscopy
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 124-125
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- August 2008
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